CROUCH, ALFRED L. <br/><br/>
DESIGN - FOR - TEST FOR DIGITAL IC'S AND EMBEDDED CORE SYSTEMS. 

 -  2008 
 - NEW DELHI  PEARSON EDUCATION INC 
 - 348 
<br/><br/><label>Subjects--Topical Terms: </label><br/>  ANALOG FILTERS
<br/><br/><label>Dewey Class. No.: </label>004.33.33  / CRO